The P100-Q2 Test Probe features a spring-loaded retractable thimble, providing consistent contact pressure while reducing wear on the probe tip. Made from beryllium copper or stainless steel with gold or nickel plating, it ensures corrosion resistance and low electrical resistance for reliable test results. Designed for high-cycle use, this probe is ideal for automated testing systems, PCB testing, and electronic component testing. The retractable thimble enhances longevity by minimizing tip wear, ensuring accurate and stable performance across repeated testing.
Features:
- Spring Retractable Thimble: Ensures consistent contact pressure and reduces wear.
- Durable Construction: Made from beryllium copper or stainless steel, plated with gold or nickel for corrosion resistance.
- Precise and Reliable: Provides accurate test results with stable contact.
- High Cycle Life: Designed for repeated use in high-frequency testing environments.
- Compatible: Fits P100-Q2 test fixtures, offering versatile application options.
- Corrosion-Resistant: Plating enhances durability and lifespan in harsh testing conditions.
- Low Electrical Resistance: Gold/nickel plating ensures optimal conductivity for reliable results.
Package Includes:
1 x P100-Q2 Test Probe, Spring Retractable Thimble
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