The P100-J1 Test Probe features a spring-loaded retractable thimble that ensures consistent contact pressure while reducing wear on the probe tip. Made from beryllium copper or stainless steel, with gold or nickel plating, it offers excellent corrosion resistance and low electrical resistance for accurate test results. Designed for high-cycle use, this probe is ideal for automated testing systems, PCB testing, and electronic component testing. The retractable thimble enhances longevity and reduces the need for frequent maintenance, ensuring reliable performance over time.
Features:
- Spring Retractable Thimble: Ensures consistent contact pressure and reduces tip wear.
- Durable Construction: Made from beryllium copper or stainless steel, with gold or nickel plating for corrosion resistance.
- Precise: Delivers stable and accurate test results.
- High Cycle Life: Designed for high-cycle use, suitable for repeated testing.
- Compatible: Fits P100-G2 test fixtures, offering flexibility in test setups.
- Corrosion-Resistant: Plating ensures extended durability and minimal maintenance.
- Low Electrical Resistance: Ensures optimal conductivity for reliable testing
Package Includes:
1 x P100-J1 Test Probe, Spring Retractable Thimble
There are no reviews yet.