P100-B1 Test Probe, Spring Retractable Thimble

The P100-B1 Test Probe features a spring-loaded retractable thimble for consistent contact pressure and reduced wear. Made from durable beryllium copper or stainless steel with gold or nickel plating, it ensures corrosion resistance and accurate test results. Designed for high-cycle use, it’s ideal for automated testing systems and PCB testing. The probe is compatible with various P100-B1 fixtures, providing long-lasting and reliable performance in precision testing applications.

Features:

1. Spring Retractable Thimble: Ensures consistent contact pressure and reduces wear on the probe tip.
2. Durable Construction: Made of high-quality beryllium copper or stainless steel, with gold or nickel plating for enhanced durability and corrosion resistance.
3. Precision Testing: Provides reliable, accurate results for high-precision applications.
4. High Cycle Life: Built to withstand repeated use in high-frequency testing environments.
5. Compatible: Fits P100-B1 test fixtures for versatility in various test setups.
6. Low Electrical Resistance: Plating ensures excellent conductivity for optimal performance.

Package Includes:

1 x P100-B1 Test Probe, Spring Retractable Thimble