P100-A2 Test Probe, Spring Retractable Thimble

The P100-A2 Test Probe with Spring-Retractable Thimble is a high-quality testing component designed for efficient and precise contact during electronics testing. This probe features a spring-loaded mechanism that allows for stable, retractable contact, ensuring reliability and accuracy for testing applications in circuit boards, component assemblies, and more. The P100-A2 probe is ideal for manufacturers, engineers, and technicians who require durable and reliable contact probes in high-volume testing environments.

Features:

1. Spring-Retractable Thimble: Ensures consistent, controlled pressure on contact points for accurate testing results.
2. High Durability: Built to withstand repeated use, ideal for rigorous testing environments.
3. Reliable Contact: Provides steady and stable contact, essential for accurate measurements and reliable data.
4. Versatile Application: Suitable for testing printed circuit boards, electronics components, and assemblies.

Package Includes:

1 x P100-A2 Test Probe, Spring Retractable Thimble